X-ray photoelectron spectroscopy and spectral transmittance study of stoichiometry in sputtered vanadium oxide filmsM. Ghanashyam Krishna; Y. Debauge; A.K. Bhattacharya · 1998

Quantitative analysis of thin oxide films using x-ray photoelectron spectroscopy and rastered ion bombardmentMcIntyre, N. S. · Journal of Vacuum Science and Technology · 1977

Chemical and electronic structure of ultrathin zirconium oxide films on silicon as determined by photoelectron spectroscopyS Miyazaki; M Narasaki; M Ogasawara; M Hirose · 2002

Formation and diffusion properties of oxide films on metals and on nitride coatings studied with Auger electron spectroscopy and X-ray photoelectron spectroscopyS Hofmann · 1990

Study of porosity of titanium oxide films by X-ray photoelectron spectroscopy and IR transmittanceLi-Jian Meng; Carlos P. Moreira de Sá; M.P. dos Santos · 1994

<i>In situ</i> core-level and valence-band photoelectron spectroscopy of reactively sputtered tungsten oxide filmsBouvard, O.; Krammer, A.; Schüler, A. · Surface and Interface Analysis · 2016

Ultraviolet photoelectron spectroscopy (UPS) of anodic oxide films on Au, Pt, Ru and Ru0.5Ir0.5 alloyR. Kötz · 1991