![[IEEE 38th Electronics Components Conference 1988., Proceedings. - Los Angeles, CA, USA (9-11 May 1988)] 38th Electronics Components Conference 1988., Proceedings. - A limited study of the effects of contact normal force, contact geometry and wipe distance on contact resistance of gold-plated contacts]()
[IEEE 38th Electronics Components Conference 1988., Proceedings. - Los Angeles, CA, USA (9-11 May 1988)] 38th Electronics Components Conference 1988., Proceedings. - A limited study of the effects of contact normal force, contact geometry and wipe distance on contact resistance of gold-plated contactsBrockman, I.H.; Sieber, C.S.; Mroczkowski, R.S. · 1988