Book review
- 期刊名称The Journal of Development Studies
- 作者Minford, Patrick; Lim, David; Wilson, Rodney; Randall, Laura; Skidmore, David; Nove, Alec; Molyneux, Maxine; Shepherd, Andrew; Goodman, D. E.; Robertson, A. F.; Robinson, Austin; Paliwala, Abdul; Fitzpatrick, Peter; Green, Reginald Herbold; Lightfoot, Paul; Gemmell, Norman; Wade, Robert
- 卷第19卷
- 期第2期
- 印刷ISSN0022-0388
- 电子ISSN1743-9140
- 文件大小2275.95KB
- 发表时间1983-01
- DOI10.1080/00220388308421863
- 页码253-281
[IEEE 2000 Symposium on VLSI Technology. Digest of Technical Papers - Honolulu, HI, USA (2000.6.13-2000.6.15)] 2000 Symposium on VLSI Technology. Digest of Technical Papers (Cat. No.00CH37104) - 2000 Symposium on VLSI Technology. Digest of Technical Papers (Cat. No.00CH37104)2000
[IEEE 2000 Symposium on VLSI Technology. Digest of Technical Papers - Honolulu, HI, USA (13-15 June 2000)] 2000 Symposium on VLSI Technology. Digest of Technical Papers (Cat. No.00CH37104) - VLSI Symposium and silicon technology: a twenty year perspectiveEl-Mansy, Y.A. · 2000
[IEEE 2000 Symposium on VLSI Technology. Digest of Technical Papers - Honolulu, HI, USA (2000.6.13-2000.6.15)] 2000 Symposium on VLSI Technology. Digest of Technical Papers (Cat. No.00CH37104) - Author index2000
[IEEE 2000 Symposium on VLSI Technology. Digest of Technical Papers - Honolulu, HI, USA (13-15 June 2000)] 2000 Symposium on VLSI Technology. Digest of Technical Papers (Cat. No.00CH37104) - Twin MONOS cell with dual control gatesHayashi, Y.; Ogura, S.; Saito, T.; Ogura, T. · 2000
[IEEE 2000 Symposium on VLSI Technology. Digest of Technical Papers - Honolulu, HI, USA (13-15 June 2000)] 2000 Symposium on VLSI Technology. Digest of Technical Papers (Cat. No.00CH37104) - New frontiers of sub-100 nm VLSI technology-moving toward device and circuit co-designFukuma, M. · 2000
[IEEE 2000 Symposium on VLSI Technology. Digest of Technical Papers - Honolulu, HI, USA (13-15 June 2000)] 2000 Symposium on VLSI Technology. Digest of Technical Papers (Cat. No.00CH37104) - SiGe heterojunctions in epitaxial vertical surrounding-gate MOSFETsDate, C.K.; Plummer, J.D. · 2000
[IEEE 2000 Symposium on VLSI Technology. Digest of Technical Papers - Honolulu, HI, USA (13-15 June 2000)] 2000 Symposium on VLSI Technology. Digest of Technical Papers (Cat. No.00CH37104) - Impacts of strained SiO/sub 2/ on TDDB lifetime projectionHarada, Y.; Eriguchi, K.; Niwa, M.; Watanabe, T.; Ohdomari, I. · 2000
[IEEE 2000 Symposium on VLSI Technology. Digest of Technical Papers - Honolulu, HI, USA (13-15 June 2000)] 2000 Symposium on VLSI Technology. Digest of Technical Papers (Cat. No.00CH37104) - A 70 nm gate length CMOS technology with 1.0 V operationOno, A.; Fukasaku, K.; Matsuda, T.; Fukai, T.; Ikezawa, N.; Imai, K.; Horiuchi, T. · 2000