Performance comparison of front- and back-illuminated modes of the AlGaN-based p-i-n solar-blind ultraviolet photodetectorsLi, Xiaojing; Zhao, Degang; Jiang, Desheng; Liu, Zongshun; Chen, Ping; Le, Lingcong; Yang, Jing; He, Xiaoguang; Zhang, Shuming; Zhu, Jianjun; Wang, Hui; Zhang, Baoshun; Liu, Jianping; Yang, Hui · Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures · 2014

Influence of residual carbon impurities in i-GaN layer on the performance of GaN-based p-i-n photodetectorsLi, Xiaojing; Zhao, Degang; Jiang, Desheng; Chen, Ping; Zhu, Jianjun; Liu, Zongshun; Le, Lingcong; Yang, Jing; He, Xiaoguang; Zhang, Liqun; Zhang, Shuming; Liu, Jianping; Yang, Hui · Journal of Vacuum Science & Technology B, Nanotechnology and Microelectronics: Materials, Processing, Measurement, and Phenomena · 2016

Utilization of polarization-inverted AlInGaN or relatively thinner AlGaN electron blocking layer in InGaN-based blue–violet laser diodesLe, Lingcong; Zhao, Degang; Jiang, Desheng; Chen, Ping; Liu, Zongshun; Zhu, Jianjun; Yang, Jing; Li, Xiaojing; He, Xiaoguang; Liu, Jianping; Zhang, Shuming; Yang, Hui · Journal of Vacuum Science & Technology B, Nanotechnology and Microelectronics: Materials, Processing, Measurement, and Phenomena · 2015

Nanofluidic interfaces in microfluidic networksMillet, Larry J.; Doktycz, Mitchel J.; Retterer, Scott T. · Journal of Vacuum Science & Technology B, Nanotechnology and Microelectronics: Materials, Processing, Measurement, and Phenomena · 2015

Electron emission from electrically isolated spheresHolgate, Joshua T.; Coppins, Michael · Journal of Vacuum Science & Technology B, Nanotechnology and Microelectronics: Materials, Processing, Measurement, and Phenomena · 2018

Tomographic measurement of buried interface roughnessHayashida, Misa; Ogawa, Shinichi; Malac, Marek · Journal of Vacuum Science & Technology B, Nanotechnology and Microelectronics: Materials, Processing, Measurement, and Phenomena · 2015

Scatterometry for nanoimprint lithographyZhu, Ruichao; Brueck, Steven R. J.; Dawson, Noel; Busani, Tito; Joseph, Praveen; Singhal, Shrawan; Sreenivasan, S. V. · Journal of Vacuum Science & Technology B, Nanotechnology and Microelectronics: Materials, Processing, Measurement, and Phenomena · 2016

Molecular ionization probability in cluster-SIMSWucher, Andreas · Journal of Vacuum Science & Technology B, Nanotechnology and Microelectronics: Materials, Processing, Measurement, and Phenomena · 2018

Camera for transmission He ⁺ ion microscopyKavanagh, Karen L.; Herrmann, Christoph; Notte, John A. · Journal of Vacuum Science & Technology B, Nanotechnology and Microelectronics: Materials, Processing, Measurement, and Phenomena · 2017

Nanodiamond vacuum field emission microtriodeHsu, Shao-Hua; Kang, Weng Poo; Raina, Supil; Howell, Mick; Huang, Jin-Hua · Journal of Vacuum Science & Technology B, Nanotechnology and Microelectronics: Materials, Processing, Measurement, and Phenomena · 2017

Dose accumulation and 3D imaging with He ⁺ ionsGiannuzzi, Lucille A. · Journal of Vacuum Science & Technology B, Nanotechnology and Microelectronics: Materials, Processing, Measurement, and Phenomena · 2015