![[ECS 212th ECS Meeting - Washington, DC (October 7 - October 12, 2007)] ECS Transactions - Nano-Scale Profile of the Dielectric Constant Near the Si/oxide Interface: A First-Principles Approach]()
[ECS 212th ECS Meeting - Washington, DC (October 7 - October 12, 2007)] ECS Transactions - Nano-Scale Profile of the Dielectric Constant Near the Si/oxide Interface: A First-Principles ApproachNakamura, Jun; Wakui, Sadakazu; Eguchi, Shunsuke; Yanai, Ryosuke; Natori, Akiko · 2007