![SPIE Proceedings [SPIE Photonics Europe - Strasbourg, France (Monday 26 April 2004)] Optical Metrology in Production Engineering - Digital holographic microscopy applied to metrology]()
SPIE Proceedings [SPIE Photonics Europe - Strasbourg, France (Monday 26 April 2004)] Optical Metrology in Production Engineering - Digital holographic microscopy applied to metrologyDepeursinge, Christian D.; Osten, Wolfgang; Takeda, Mitsuo; Charriere, Florian; Marian, Anca M.; Montfort, Frederic; Colomb, Tristan; Kuhn, Jonas; Cuche, Etienne; Emery, Yves; Marquet, Pierre; Magistretti, Pierre J. · 2004