![SPIE Proceedings [SPIE Polarimetry '90, Huntsville, AL - Huntsville, AL (Monday 14 May 1990)] Polarimetry: Radar, Infrared, Visible, Ultraviolet, and X-Ray - <title>Determination of the refractive-index tensor by bireflectance in biaxial crystals</title>]()
SPIE Proceedings [SPIE Polarimetry '90, Huntsville, AL - Huntsville, AL (Monday 14 May 1990)] Polarimetry: Radar, Infrared, Visible, Ultraviolet, and X-Ray - <title>Determination of the refractive-index tensor by bireflectance in biaxial crystals</title>Lotem, Haim; Burshtein, Zeev; Chipman, Russell A.; Morris, John W. · 1990