[IEEE 2007 29th Electrical Overstress/Electrostatic Discharge Symposium (EOS/ESD) - Anaheim, CA, USA (2007.09.16-2007.09.21)] 2007 29th Electrical Overstress/Electrostatic Discharge Symposium (EOS/ESD) - Layout technique to alleviate soft failure for short pitch multi finger ESD protection devicesMototsugu Okushima, ; Tsutomu Shinzaw, ; Yasuyuki Morishita, · 2007