![[IEEE 2005 IEEE International Workshop on Current and Defect Based Testing, 2005. DBT 2005. - Palm Spring, CA, USA (May 1, 2005)] Proceedings. 2005 IEEE International Workshop on Current and Defect Based Testing, 2005. DBT 2005. - Electrical analysis of a domino logic cell with GOS faults]()
[IEEE 2005 IEEE International Workshop on Current and Defect Based Testing, 2005. DBT 2005. - Palm Spring, CA, USA (May 1, 2005)] Proceedings. 2005 IEEE International Workshop on Current and Defect Based Testing, 2005. DBT 2005. - Electrical analysis of a domino logic cell with GOS faultsComte, M.; Ohtake, S.; Fujiwara, H.; Renovell, M. · 2005