![[IEEE 2010 IEEE/MTT-S International Microwave Symposium - MTT 2010 - Anaheim, CA, USA (2010.05.23-2010.05.28)] 2010 IEEE MTT-S International Microwave Symposium - Modeling and metrology of metallic nanowires with application to microwave interconnects]()
[IEEE 2010 IEEE/MTT-S International Microwave Symposium - MTT 2010 - Anaheim, CA, USA (2010.05.23-2010.05.28)] 2010 IEEE MTT-S International Microwave Symposium - Modeling and metrology of metallic nanowires with application to microwave interconnectsKim, Kichul; Wallis, T. Mitch; Rice, Paul; Chiang, Chin-Jen; Imtiaz, Atif; Kabos, Pavel; Filipovic, Dejan S. · 2010