![[IEEE 2008 15th International Symposium on the Physical and Failure Analysis of Integrated Circuits - singapore (2008.07.7-2008.07.11)] 2008 15th International Symposium on the Physical and Failure Analysis of Integrated Circuits - Reliability of ZrO<inf>2</inf>/GeO<inf>x</inf>N<inf>y</inf> stacked high-k dielectrics on Ge under dynamic and pulsed voltage stress]()
[IEEE 2008 15th International Symposium on the Physical and Failure Analysis of Integrated Circuits - singapore (2008.07.7-2008.07.11)] 2008 15th International Symposium on the Physical and Failure Analysis of Integrated Circuits - Reliability of ZrO<inf>2</inf>/GeO<inf>x</inf>N<inf>y</inf> stacked high-k dielectrics on Ge under dynamic and pulsed voltage stressMahata, C.; Bera, M. K.; Bose, P.K.; Chakraborty, A.; SenGupta, M.; Maiti, C. K. · 2008