![SPIE Proceedings [SPIE SPIE's First International Symposium on Fluctuations and Noise - Santa Fe, NM (Sunday 1 June 2003)] Noise and Information in Nanoelectronics, Sensors, and Standards - <title>Current noise in diffusive S/N and S/N/S junctions</title>]()
SPIE Proceedings [SPIE SPIE's First International Symposium on Fluctuations and Noise - Santa Fe, NM (Sunday 1 June 2003)] Noise and Information in Nanoelectronics, Sensors, and Standards - <title>Current noise in diffusive S/N and S/N/S junctions</title>Hoffmann, Christian; Lefloch, Francois; Quirion, David; Sanquer, Marc; Kish, Laszlo B.; Green, Frederick; Iannaccone, Giuseppe; Vig, John R. · 2003