发现好书期刊,享受阅读乐趣

海量图书期刊资源,随时随地畅享阅读乐趣

Experimental and theoretical study of image bias in x-ray lithography

Experimental and theoretical study of image bias in x-ray lithography

Guo, Jerry Z. Y.
  • 期刊名称Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures
  • 作者Guo, Jerry Z. Y.
  • 卷第10卷
  • 期第6期
  • 印刷ISSN0734-211X
  • 文件大小791.15KB
  • 发表时间1992-11
  • DOI10.1116/1.585901
← 返回【学霸图书馆】主页