![SPIE Proceedings [SPIE IS&T/SPIE's Symposium on Electronic Imaging: Science & Technology - San Jose, CA (Sunday 5 February 1995)] Machine Vision Applications in Industrial Inspection III - <title>Development of color-vision-based solutions for lumber grading</title>]()
SPIE Proceedings [SPIE IS&T/SPIE's Symposium on Electronic Imaging: Science & Technology - San Jose, CA (Sunday 5 February 1995)] Machine Vision Applications in Industrial Inspection III - <title>Development of color-vision-based solutions for lumber grading</title>Kauppinen, Hannu; Silven, Olli; Wu, Frederick Y.; Wilson, Stephen S. · 1995