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A Case Study of Problems in JEDEC HBM ESD Test StandardMingxu Huo, ; Qing Guo, ; Yan Han, ; Lei Shen, ; Qi Liu, ; Bo Song, ; Qingrong Ma, ; Kehan Zhu, ; Yehui Shen, ; Xiaoyang Du, ; Shurong Dong, · IEEE Transactions on Device and Materials Reliability · 2009