![SPIE Proceedings [SPIE 5th International Symposium on Advanced Optical Manufacturing and Testing Technologies - Dalian, China (Monday 26 April 2010)] 5th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment - <title>Aspheric surface testing by irradiance transport equation</title>]()
SPIE Proceedings [SPIE 5th International Symposium on Advanced Optical Manufacturing and Testing Technologies - Dalian, China (Monday 26 April 2010)] 5th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment - <title>Aspheric surface testing by irradiance transport equation</title>Shomali, Ramin; Darudi, Ahmad; Nasiri, Sadollah; Asgharsharghi Bonab, Armir; Zhang, Yudong; Sasián, José; Xiang, Libin; To, Sandy · 2010