Multiple-crystal x-ray topographic characterization of periodically domain-inverted KTiOPO4 crystal
- 期刊名称Applied Physics Letters
- 作者Hu, Z. W.; Thomas, P. A.; Gupta, Mool C.; Risk, W. P.
- 卷第66卷
- 期第1期
- 印刷ISSN0003-6951
- 文件大小497.09KB
- 发表时间1995
- DOI10.1063/1.114165
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