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[IEEE Comput. Soc Sixth Asian Test Symposium (ATS'97) - Akita, Japan (17-19 Nov. 1997)] Proceedings Sixth Asian Test Symposium (ATS'97) - Computing stress tests for interconnect defects

[IEEE Comput. Soc Sixth Asian Test Symposium (ATS'97) - Akita, Japan (17-19 Nov. 1997)] Proceedings Sixth Asian Test Symposium (ATS'97) - Computing stress tests for interconnect defects

Dabholkar, V.; Chakravarty, S.

作者Dabholkar, V.; Chakravarty, S.
文件大小613.98KB
发表时间1997
DOI10.1109/ats.1997.643950
页码143-148

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