![SPIE Proceedings [SPIE Optical Systems Design 2005 - Jena, Germany (Monday 12 September 2005)] Detectors and Associated Signal Processing II - Bessel beam based optical profilometry]()
SPIE Proceedings [SPIE Optical Systems Design 2005 - Jena, Germany (Monday 12 September 2005)] Detectors and Associated Signal Processing II - Bessel beam based optical profilometryBelyi, V.; Chatard, Jean-Pierre; Dennis, Peter N. J.; Kroening, M.; Kazak, N.; Khilo, N.; Mashchenko, A.; Ropot, P. · 2005