![[IEEE 2010 IEEE International Reliability Physics Symposium - Garden Grove (Anaheim), CA, USA (2010.05.2-2010.05.6)] 2010 IEEE International Reliability Physics Symposium - Robust high current ESD performance of nano-meter scale DeNMOS by source ballasting]()
[IEEE 2010 IEEE International Reliability Physics Symposium - Garden Grove (Anaheim), CA, USA (2010.05.2-2010.05.6)] 2010 IEEE International Reliability Physics Symposium - Robust high current ESD performance of nano-meter scale DeNMOS by source ballastingChatterjee, Amitabh; Brewer, Forrest; Gossner, Harald; Pendharkar, Sameer; Duvvury, Charvaka · 2010