Lithium: Thyroid Effects and Altered Renal Handling
- 期刊名称Clinical Toxicology
- 作者Oakley, Patrick W.; Oakley, Patrick; Dawson, Andrew H.; Whyte, Ian M.
- 卷第38卷
- 期第3期
- 印刷ISSN1556-3650
- 电子ISSN1556-9519
- 文件大小93.23KB
- 发表时间2000-01
- DOI10.1081/clt-100100941
- 页码333-337
[IEEE 9th International Symposium on Quality Electronic Design (isqed 2008) - San Jose, CA, USA (2008.03.17-2008.03.19)] 9th International Symposium on Quality Electronic Design (isqed 2008) - Table of Contents2008
[IEEE 2008 9th International Symposium of Quality of Electronic Design (ISQED) - San Jose, CA, USA (2008.03.17-2008.03.19)] 9th International Symposium on Quality Electronic Design (isqed 2008) - Luncheon Keynote SpeechDomic, Antun · 2008
[IEEE 2008 9th International Symposium of Quality of Electronic Design (ISQED) - San Jose, CA, USA (2008.03.17-2008.03.19)] 9th International Symposium on Quality Electronic Design (isqed 2008) - System Verilog for Quality of Results (QoR)Surepeddi, Ravi · 2008
[IEEE 2008 9th International Symposium of Quality of Electronic Design (ISQED) - San Jose, CA, USA (2008.03.17-2008.03.19)] 9th International Symposium on Quality Electronic Design (isqed 2008) - Strategies for Quality CAD PDKsGadepally, Kamesh V.; Young, Mark; Lin, James; Franklin, Andy; Perumal, Ravi; Joshi, Sridhar · 2008
[IEEE 2008 9th International Symposium of Quality of Electronic Design (ISQED) - San Jose, CA, USA (2008.03.17-2008.03.19)] 9th International Symposium on Quality Electronic Design (isqed 2008) - Processor Verification with hwBugHuntSudhakrishnan, Sangeetha; Su, Liying; Renau, Jose · 2008
[IEEE 2008 9th International Symposium of Quality of Electronic Design (ISQED) - San Jose, CA, USA (2008.03.17-2008.03.19)] 9th International Symposium on Quality Electronic Design (isqed 2008) - High-Quality Circuit Synthesis for Modern TechnologiesJozwiak, Lech; Chojnacki, Artur; Slusarczyk, Aleksander · 2008
[IEEE 2008 9th International Symposium of Quality of Electronic Design (ISQED) - San Jose, CA, USA (2008.03.17-2008.03.19)] 9th International Symposium on Quality Electronic Design (isqed 2008) - A Basis for Formal Robustness CheckingFey, Goerschwin; Drechsler, Rolf · 2008
[IEEE 2008 9th International Symposium of Quality of Electronic Design (ISQED) - San Jose, CA, USA (2008.03.17-2008.03.19)] 9th International Symposium on Quality Electronic Design (isqed 2008) - Runtime Validation of Transactional Memory SystemsChen, Kaiyu; Malik, Sharad; Patra, Priyadarsan · 2008