![[IEEE IEEE International Test Conference - (ITC) - Baltimore, MD, USA (17-21 Oct. 1993)] Proceedings of IEEE International Test Conference - (ITC) - VINCI: Secure test of a VLSI high-speed encryption system]()
[IEEE IEEE International Test Conference - (ITC) - Baltimore, MD, USA (17-21 Oct. 1993)] Proceedings of IEEE International Test Conference - (ITC) - VINCI: Secure test of a VLSI high-speed encryption systemBonnenberg, H.; Curiger, A.; Felber, N.; Kaeslin, H.; ZImmermann, R.; Fichtner, W. · 1993