[IEEE 2013 IEEE/MTT-S International Microwave Symposium - MTT 2013 - Seattle, WA, USA (2013.06.2-2013.06.7)] 2013 IEEE MTT-S International Microwave Symposium Digest (MTT) - Linearity analysis of millimeter wave GaN power transistors through X-parameters and TCAD device simulationsGuerra, Diego; Saraniti, Marco; Ferry, David K.; Goodnick, Stephen M. · 2013