![[IEEE 2007 First IEEE International Conference on Biometrics: Theory, Applications, and Systems - Crystal City, VA, USA (2007.09.27-2007.09.29)] 2007 First IEEE International Conference on Biometrics: Theory, Applications, and Systems - A new probabilistic Iris Quality Measure for comprehensive noise detection]()
[IEEE 2007 First IEEE International Conference on Biometrics: Theory, Applications, and Systems - Crystal City, VA, USA (2007.09.27-2007.09.29)] 2007 First IEEE International Conference on Biometrics: Theory, Applications, and Systems - A new probabilistic Iris Quality Measure for comprehensive noise detectionKrichen, Emine; Garcia-Salicetti, Sonia; Dorizzi, Bernadette · 2007