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The rise of computational techniques in atom probe microscopyCeguerra, Anna V.; Breen, Andrew J.; Stephenson, Leigh T.; Felfer, Peter J.; Araullo-Peters, Vicente J.; Liddicoat, Peter V.; Cui, XiangYuan; Yao, Lan; Haley, Daniel; Moody, Michael P.; Gault, Baptiste; Cairney, Julie M.; Ringer, Simon P. · Current Opinion in Solid State and Materials Science · 2013