![SPIE Proceedings [SPIE Electron Technology Conference ELTE 2016 - Wisla, Poland (Sunday 11 September 2016)] Electron Technology Conference 2016 - Effect of interface traps parameters on admittance characteristics of the MIS (metal-insulator-semiconductor) tunnel structures]()
SPIE Proceedings [SPIE Electron Technology Conference ELTE 2016 - Wisla, Poland (Sunday 11 September 2016)] Electron Technology Conference 2016 - Effect of interface traps parameters on admittance characteristics of the MIS (metal-insulator-semiconductor) tunnel structuresSwatowska, Barbara; Maziarz, Wojciech; Pisarkiewicz, Tadeusz; Kucewicz, Wojciech; Jasiński, Jakub; Mazurak, Andrzej; Majkusiak, Bogdan · 2016