发现好书期刊,享受阅读乐趣

海量图书期刊资源,随时随地畅享阅读乐趣

Characterization of Metal Oxide Surfaces and Thin Semiconductor Films by Inelastic Electron Tunneling Spectroscopy.

Characterization of Metal Oxide Surfaces and Thin Semiconductor Films by Inelastic Electron Tunneling Spectroscopy.

HIGO, Morihide; KAMATA, Satsuo
  • 期刊名称Analytical Sciences
  • 作者HIGO, Morihide; KAMATA, Satsuo
  • 卷第18卷
  • 期第3期
  • 印刷ISSN0910-6340
  • 电子ISSN1348-2246
  • 文件大小687.54KB
  • 发表时间2002
  • DOI10.2116/analsci.18.227
  • 页码227-242
← 返回【学霸图书馆】主页