Characterization of Metal Oxide Surfaces and Thin Semiconductor Films by Inelastic Electron Tunneling Spectroscopy.
HIGO, Morihide; KAMATA, Satsuo
- 期刊名称Analytical Sciences
- 作者HIGO, Morihide; KAMATA, Satsuo
- 卷第18卷
- 期第3期
- 印刷ISSN0910-6340
- 电子ISSN1348-2246
- 文件大小687.54KB
- 发表时间2002
- DOI10.2116/analsci.18.227
- 页码227-242