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[IEEE 2003 IEEE Conference on Electron Devices and Solid-State Circuits - Hong Kong, China (16-18 Dec. 2003)] 2003 IEEE Conference on Electron Devices and Solid-State Circuits (IEEE Cat. No.03TH8668) - Rigorous modeling of high-speed semiconductor devices

[IEEE 2003 IEEE Conference on Electron Devices and Solid-State Circuits - Hong Kong, China (16-18 Dec. 2003)] 2003 IEEE Conference on Electron Devices and Solid-State Circuits (IEEE Cat. No.03TH8668) - Rigorous modeling of high-speed semiconductor devices

Palankovski, V.; Selberherr, S.
  • 作者Palankovski, V.; Selberherr, S.
  • 文件大小498.87KB
  • 发表时间2003
  • DOI10.1109/edssc.2003.1283498
  • 页码127-132
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