![[IEEE 2010 IEEE Instrumentation & Measurement Technology Conference Proceedings - Austin, TX, USA (2010.05.3-2010.05.6)] 2010 IEEE Instrumentation & Measurement Technology Conference Proceedings - Analyzing DAC waveform distortion due to finite settling time]()
[IEEE 2010 IEEE Instrumentation & Measurement Technology Conference Proceedings - Austin, TX, USA (2010.05.3-2010.05.6)] 2010 IEEE Instrumentation & Measurement Technology Conference Proceedings - Analyzing DAC waveform distortion due to finite settling timeD'Apuzzo, Massimo; D'Arco, Mauro; Liccardo, Annalisa; Vadursi, Michele · 2010