![SPIE Proceedings [SPIE SPIE Optical Engineering + Applications - San Diego, California, United States (Sunday 17 August 2014)] X-Ray Free-Electron Lasers: Beam Diagnostics, Beamline Instrumentation, and Applications II - Polarization measurement of free electron laser pulses in the VUV generated by the variable polarization source FERMI]()
SPIE Proceedings [SPIE SPIE Optical Engineering + Applications - San Diego, California, United States (Sunday 17 August 2014)] X-Ray Free-Electron Lasers: Beam Diagnostics, Beamline Instrumentation, and Applications II - Polarization measurement of free electron laser pulses in the VUV generated by the variable polarization source FERMIHau-Riege, Stefan P.; Moeller, Stefan P.; Yabashi, Makina; Finetti, P.; Allaria, E.; Diviacco, B.; Callegari, C.; Mahieu, B.; Viefhaus, J.; Zangrando, M.; De Ninno, G.; Lambert, G.; Ferrari, E.; Buck, J.; Ilchen, M.; Vodungbo, B.; Mahne, N.; Svetina, C.; Spezzani, C.; Di Mitri, S.; Penco, G.; Trovò, M.; Fawley, W. M.; Rebernik, P.; Gauthier, D.; Grazioli, C.; Coreno, M.; Ressel, B.; Kivimäki, A.; Mazza, T.; Glaser, L.; Scholz, F.; Seltmann, J.; Gessler, P.; Grünert, J.; De Fanis, A.; Meyer, M.; Knie, A.; Moeller, S. P.; Raimondi, L.; Capotondi, F.; Pedersoli, E.; Plekan, O.; Danailov, M.; Demidovich, A.; Nikolov, I.; Abrami, A.; Gautier, J.; Lüning, J.; Zeitoun, P.; Giannessi, L. · 2014