Maths Resource: Estimation
- 期刊名称Mathematics in School
- 作者Ian Fisher
- 卷第33卷
- 期第5期
- 印刷ISSN0305-7259
- 文件大小479.87KB
- 发表时间2004-11
- DOI10.2307/30215740
- 页码9-11
[IEEE 2010 11th International Symposium on Quality of Electronic Design (ISQED) - San Jose, CA, USA (2010.03.22-2010.03.24)] 2010 11th International Symposium on Quality Electronic Design (ISQED) - Cover2010
[IEEE 2010 11th International Symposium on Quality of Electronic Design (ISQED) - San Jose, CA, USA (2010.03.22-2010.03.24)] 2010 11th International Symposium on Quality Electronic Design (ISQED) - Spine2010
[IEEE 2010 11th International Symposium on Quality of Electronic Design (ISQED) - San Jose, CA, USA (2010.03.22-2010.03.24)] 2010 11th International Symposium on Quality Electronic Design (ISQED) - Copyright2010
[IEEE 2010 11th International Symposium on Quality of Electronic Design (ISQED) - San Jose, CA, USA (2010.03.22-2010.03.24)] 2010 11th International Symposium on Quality Electronic Design (ISQED) - Cover2010
[IEEE 2010 11th International Symposium on Quality of Electronic Design (ISQED) - San Jose, CA, USA (2010.03.22-2010.03.24)] 2010 11th International Symposium on Quality Electronic Design (ISQED) - Title page2010
[IEEE 2010 11th International Symposium on Quality of Electronic Design (ISQED) - San Jose, CA, USA (2010.03.22-2010.03.24)] 2010 11th International Symposium on Quality Electronic Design (ISQED) - ISQED 2010 best papers2010
[IEEE 2010 11th International Symposium on Quality of Electronic Design (ISQED) - San Jose, CA, USA (2010.03.22-2010.03.24)] 2010 11th International Symposium on Quality Electronic Design (ISQED) - SQED 2010 organizing committee2010
[IEEE 2010 11th International Symposium on Quality of Electronic Design (ISQED) - San Jose, CA, USA (2010.03.22-2010.03.24)] 2010 11th International Symposium on Quality Electronic Design (ISQED) - ISQED 2010 - table of contents2010
A SELECTIVE REPLACEMENT METHOD FOR TIMING-ERROR-PREDICTING FLIP-FLOPSKUNITAKE, YUJI; SATO, TOSHINORI; YASUURA, HIROTO; HAYASHIDA, TAKANORI · Journal of Circuits, Systems and Computers · 2012
[IEEE 2012 International Symposium on Communications and Information Technologies (ISCIT) - Gold Coast, Australia (2012.10.2-2012.10.5)] 2012 International Symposium on Communications and Information Technologies (ISCIT) - Guidelines for mitigating NBTI degradation in on-chip memoriesKunitake, Yuji; Sato, Toshinori; Yasuura, Hiroto; Hayashida, Takanori · 2012
[IEEE 2010 IEEE 16th Pacific Rim International Symposium on Dependable Computing (PRDC) - Tokyo, Japan (2010.12.13-2010.12.15)] 2010 IEEE 16th Pacific Rim International Symposium on Dependable Computing - A Replacement Strategy for Canary Flip-FlopsKunitake, Yuji; Sato, Toshinori; Yasuura, Hiroto · 2010
[IEEE 2010 2nd Asia Symposium on Quality Electronic Design (ASQED 2010) - Penang, Malaysia (2010.08.3-2010.08.4)] 2nd Asia Symposium on Quality Electronic Design (ASQED) - A case study of Short Term Cell-Flipping technique for mitigating NBTI degradation on cacheKunitake, Yuji; Sato, Toshinori; Yasuura, Hiroto · 2010
[IEEE 2011 IEEE 54th International Midwest Symposium on Circuits and Systems (MWSCAS) - Seoul, Korea (South) (2011.08.7-2011.08.10)] 2011 IEEE 54th International Midwest Symposium on Circuits and Systems (MWSCAS) - Possibilities to miss predicting timing errors in canary flip-flopsKunitake, Yuji; Sato, Toshinori; Yasuura, Hiroto; Hayashida, Takanori · 2011
[IEEE 2011 IEEE 54th International Midwest Symposium on Circuits and Systems (MWSCAS) - Seoul, Korea (South) (2011.08.7-2011.08.10)] 2011 IEEE 54th International Midwest Symposium on Circuits and Systems (MWSCAS) - A Selective replacement method for timing-error-predicting flip-flopsKunitake, Yuji; Sato, Toshinori; Yasuura, Hiroto; Hayashida, Takanori · 2011