[ACM Press the 2010 ACM-IEEE International Symposium - Bolzano-Bozen, Italy (2010.09.16-2010.09.17)] Proceedings of the 2010 ACM-IEEE International Symposium on Empirical Software Engineering and Measurement - ESEM '10 - An event-based empirical process analysis frameworkSunindyo, Wikan Danar; Biffl, Stefan; Mordinyi, Richard; Moser, Thomas; Schatten, Alexander; Tabatabai, Mohammed; Wahyudin, Dindin; Weippl, Edgar; Winkler, Dietmar · 2010

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