![Combined Application of Section and Projection Topography to Defect Analysis in PVT-Grown 4H-SiC]()
Combined Application of Section and Projection Topography to Defect Analysis in PVT-Grown 4H-SiCWang, H.; Wu, F.; Byrappa, S.; Shun, S.; Raghothamachar, B.; Dudley, M.; Sanchez, E. K.; Chung, G.; Hansen, D.; Mueller, S. G.; Loboda, M. J. · MRS Proceedings · 2012