[IEEE 2005 Proceedings. 55th Electronic Components and Technology Conference - Lake Buena Vista, FL (2005.05.31-2005.06.3)] Proceedings Electronic Components and Technology, 2005. ECTC '05. - Novel Hermetic Wafer-Level-Packaging Technology using Low-Temperature Passivation
- 作者Leib, J.; Mund, D.; Topper, M.
- 文件大小909.74KB
- 发表时间2005
- DOI10.1109/ectc.2005.1441323
- 页码562-565
Zirkon und HafniumM. Speter; R. D. Reed; J. R. Withrow; St. G. Simpson; W. C. Schumb; R. Ruer; Th. R. Cunningham; R. J. Price; P. Wenger; M. Müller; L. Moser; R. Lessnig; J. H. de Boer; H. F. Harwood · 1933
ProceedingsJohn F. Reed, A. C. Hodson, W. O. Sohre, W. D. Billings, E. S. Deevey Jr., LaMont C. Cole, Norman D. Knox, Stanley A. Cain, Rexford F. Daubenmire, Paul R. Needham, Paul B. Sears, Alexander C. Hodson, Henry J. Oosting, William A. Dreyer, W. T. Edmondson, F. E. Egler, R. W. Pennak, C. H. Muller, E. L. Stone, F. R. Fosberg, John T. Curtis, Jas. A. Macnab, J. P. Scott, J. E. Potzger, John Pelton, B. H. Ketchum, E. P. Odum, Orlando Park, Francis C. Evans, Herbert C. Hanson, Robert B. Platt, Willis A. Eggler, Grant Cottam, Robert A. Darrow, Curtis L. Newcombe, William A. Dayton, J. M. Aikman, Reed W. Fautin and John E. Potzger · Bulletin of the Ecological Society of America · 1956
As quantum dotsSleight, J. W.; Hornbeck, E. S.; Deshpande, M. R.; Wheeler, R. G.; Reed, M. A.; Bowen, R. C.; Frensley, W. R.; Randall, J. N.; Matyi, R. J. · Physical Review B · 1996
ABSTRACTSANDERSON, E.; BROWN, C. M.; BOURNE, D. T.; CAMPBELL, I.; HAMMOND, J. R. M.; HEMMENS, W. F.; HOSSACK, J. A.; LOMATH, A. W.; MACWILLIAM, I. C.; MANNERS, D. J.; MAYO, D. A.; MULLER, R.; SLAUGHTER, J. C.; STEVENS, R.; WOODWARD, J. D.; REED, R. J. R. · Journal of the Institute of Brewing · 1994
A Digital Approach to Power-System Engineering-IReed, Myril B.; Reed, Georgia B.; McKinley, J. L.; Polk, H. K.; Hugo, R. V.; Martin, W. J. · 1961
A Digital Approach to Power-System Engineering-IIReed, Myril B.; Reed, Georgia B.; McKinley, J. L.; Polk, H. K.; Hugo, R. V.; Martin, W. J. · 1961
Electron-Induced Single-Event Upsets in Static Random Access MemoryKing, M. P.; Reed, R. A.; Weller, R. A.; Mendenhall, M. H.; Schrimpf, R. D.; Sierawski, B. D.; Sternberg, A. L.; Narasimham, B.; Wang, J. K.; Pitta, E.; Bartz, B.; Reed, D.; Monzel, C.; Baumann, R. C.; Deng, X.; Pellish, J. A.; Berg, M. D.; Seidleck, C. M.; Auden, E. C.; Weeden-Wright, S. L.; Gaspard, N. J.; Zhang, C. X.; Fleetwood, D. M. · IEEE Transactions on Nuclear Science · 2013
NotesHaines, R. T. M.; Drummond, J. C.; Reed, R. A.; Stock, C. J. H. · The Analyst · 1938
Meet Our Regional EditorBenedetto, Francesco · Recent Advances in Electrical & Electronic Engineering (Formerly Recent Patents on Electrical & Electronic Engineering) · 2018
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Acknowledgements to ReviewersRecent Advances in Electrical & Electronic Engineering (Formerly Recent Patents on Electrical & Electronic Engineering) · 2018
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Preface:Zhou, Huiyu · Recent Advances in Electrical & Electronic Engineering (Formerly Recent Patents on Electrical & Electronic Engineering) · 2016
Acknowledgements to ReviewersRecent Advances in Electrical & Electronic Engineering (Formerly Recent Patents on Electrical & Electronic Engineering) · 2017
PrefaceZhou, Huiyu · Recent Advances in Electrical & Electronic Engineering (Formerly Recent Patents on Electrical & Electronic Engineering) · 2019