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[IEEE IEEE International Conference on Test, 2005. - Charlotte, NC, USA (Nov. 8, 2005)] IEEE International Conference on Test, 2005. - Methods for improving test compression

[IEEE IEEE International Conference on Test, 2005. - Charlotte, NC, USA (Nov. 8, 2005)] IEEE International Conference on Test, 2005. - Methods for improving test compression

Touba, N.A.

作者Touba, N.A.
文件大小232.28KB
发表时间2005
DOI10.1109/test.2005.1584115
页码1292-1293

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