![[IEEE The 18th IEEE International Symposium on Software Reliability (ISSRE '07) - Trollhattan, Sweden (2007.11.5-2007.11.9)] The 18th IEEE International Symposium on Software Reliability (ISSRE '07) - Using In-Process Testing Metrics to Estimate Post-Release Field Quality]()
[IEEE The 18th IEEE International Symposium on Software Reliability (ISSRE '07) - Trollhattan, Sweden (2007.11.5-2007.11.9)] The 18th IEEE International Symposium on Software Reliability (ISSRE '07) - Using In-Process Testing Metrics to Estimate Post-Release Field QualityNagappan, Nachiappan; Williams, Laurie; Vouk, Mladen; Osborne, Jason · 2007