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Dependences of the Al thickness and annealing temperature on the structural, optical and electrical properties in ZnO/Al multilayers

Dependences of the Al thickness and annealing temperature on the structural, optical and electrical properties in ZnO/Al multilayers

Y.M. Hu; C.W. Lin; J.C.A. Huang

作者Y.M. Hu; C.W. Lin; J.C.A. Huang
卷第497卷
印刷ISSN0040-6090
文件大小187.86KB
发表时间2006
DOI10.1016/j.tsf.2005.10.058
页码130-134

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