[IEEE 2007 International Symposium on VLSI Design, Automation and Test - Hsinchu, Taiwan (2007.04.25-2007.04.27)] 2007 International Symposium on VLSI Design, Automation and Test (VLSI-DAT) - Challenges and Solutions in Modern VLSI Placement
Jiang, Zhe-Wei; Chen, Hsin-Chen; Chen, Tung-Chieh; Chang, Yao-Wen
- 作者Jiang, Zhe-Wei; Chen, Hsin-Chen; Chen, Tung-Chieh; Chang, Yao-Wen
- 文件大小3331.51KB
- 发表时间2007
- DOI10.1109/VDAT.2007.373223
- 页码1-5