![SPIE Proceedings [SPIE Optical Science and Technology, SPIE's 48th Annual Meeting - San Diego, CA (Sunday 3 August 2003)] Polarization Science and Remote Sensing - <title>Active detection of off-diagonal Mueller elements of rough targets</title>]()
SPIE Proceedings [SPIE Optical Science and Technology, SPIE's 48th Annual Meeting - San Diego, CA (Sunday 3 August 2003)] Polarization Science and Remote Sensing - <title>Active detection of off-diagonal Mueller elements of rough targets</title>Hoover, Brian G.; Dayton, David C.; Havey, Jason E.; Gonglewski, John D.; Gamiz, Victor L.; Ulibarri, Laura J.; Shaw, Joseph A.; Tyo, J. Scott · 2003