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SPIE Proceedings [SPIE 3rd International Symposium on Advanced Optical Manufacturing and testing technologies: Optical test and Measurement Technology and Equipment - Chengdu, China (Sunday 8 July 2007)] 3rd International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment - 3-D topography measurement by moire stripe

SPIE Proceedings [SPIE 3rd International Symposium on Advanced Optical Manufacturing and testing technologies: Optical test and Measurement Technology and Equipment - Chengdu, China (Sunday 8 July 2007)] 3rd International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment - 3-D topography measurement by moire stripe

Qiu, Jianxin; Pan, Junhua; Wyant, James C.; Tan, Liang; Zhong, Ping; Wang, Hexin
  • 作者Qiu, Jianxin; Pan, Junhua; Wyant, James C.; Tan, Liang; Zhong, Ping; Wang, Hexin
  • 卷第6723卷
  • 印刷ISSN0277-786X
  • 文件大小556.05KB
  • 发表时间2007
  • DOI10.1117/12.783304
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