![[IEEE 2010 Conference on Precision Electromagnetic Measurements (CPEM 2010) - Daejeon, Korea (South) (2010.06.13-2010.06.18)] CPEM 2010 - Voltage traceability of Johnson noise thermometry by ac-dc transfer method]()
[IEEE 2010 Conference on Precision Electromagnetic Measurements (CPEM 2010) - Daejeon, Korea (South) (2010.06.13-2010.06.18)] CPEM 2010 - Voltage traceability of Johnson noise thermometry by ac-dc transfer methodManta, F.; Callegaro, L.; Pisani, M.; Ortolano, M.; D'Elia, V. · 2010