[IEEE TENCON 2009 - 2009 IEEE Region 10 Conference - Singapore (2009.01.23-2009.01.26)] TENCON 2009 - 2009 IEEE Region 10 Conference - Modelling of complex interconnect structures
- 作者Rustagi, Aayush; Jain, Kanika
- 文件大小612.70KB
- 发表时间2009
- DOI10.1109/tencon.2009.5396240
- 页码1-6
ACOUSTIC DETERMINANTS OF PERCEPTIONS OF PERSONALITY FROM SPEECHBROWN, BRUCE L.; STRONG, WILLIAM J.; RENCHER, ALVIN C. · Linguistics · 1975
Reliability Wearout Mechanisms in Advanced CMOS Technologies ||Strong, Alvin W.; Wu, Ernest Y.; Vollertsen, Rolf-Peter; Su, Jordi; La Rosa, Giuseppe; Rauch, Stewart E.; Sullivan, Timothy D. · 2009
ACOUSTIC DETERMINANTS OF PERCEPTIONS OF PERSONALITY FROM SPEECHBROWN, BRUCE L.; STRONG, WILLIAM J.; RENCHER, ALVIN C. · International Journal of the Sociology of Language · 1975
Reliability Wearout Mechanisms in Advanced CMOS Technologies || FrontmatterStrong, Alvin W.; Wu, Ernest Y.; Vollertsen, Rolf-Peter; Su, Jordi; La Rosa, Giuseppe; Rauch, Stewart E.; Sullivan, Timothy D. · 2009
Reliability Wearout Mechanisms in Advanced CMOS Technologies || IndexStrong, Alvin W.; Wu, Ernest Y.; Vollertsen, Rolf-Peter; Su, Jordi; La Rosa, Giuseppe; Rauch, Stewart E.; Sullivan, Timothy D. · 2009
Reliability Wearout Mechanisms in Advanced CMOS Technologies || IntroductionStrong, Alvin W.; Wu, Ernest Y.; Vollertsen, Rolf-Peter; Su, Jordi; La Rosa, Giuseppe; Rauch, Stewart E.; Sullivan, Timothy D. · 2009
Reliability Wearout Mechanisms in Advanced CMOS Technologies || ElectromigrationStrong, Alvin W.; Wu, Ernest Y.; Vollertsen, Rolf-Peter; Su, Jordi; La Rosa, Giuseppe; Rauch, Stewart E.; Sullivan, Timothy D. · 2009
Reliability Wearout Mechanisms in Advanced CMOS Technologies || Hot CarriersStrong, Alvin W.; Wu, Ernest Y.; Vollertsen, Rolf-Peter; Su, Jordi; La Rosa, Giuseppe; Rauch, Stewart E.; Sullivan, Timothy D. · 2009