![SPIE Proceedings [SPIE SPIE Optical Engineering + Applications - San Diego, California, United States (Sunday 9 August 2015)] Imaging Spectrometry XX - A comparative study of three vision systems for metal surface defect detection]()
SPIE Proceedings [SPIE SPIE Optical Engineering + Applications - San Diego, California, United States (Sunday 9 August 2015)] Imaging Spectrometry XX - A comparative study of three vision systems for metal surface defect detectionPagano, Thomas S.; Silny, John F.; Mehrubeoglu, Mehrube; Simionescu, Petru-Aurelian; Robinson, Shawn; McLauchlan, Lifford · 2015