Book reviews
- 期刊名称International Journal of Early Years Education
- 作者Ang, Lyn; Waite, Sue; Goouch, Kathleen; Brooker, Liz; Montgomery, Heather
- 卷第17卷
- 期第3期
- 印刷ISSN0966-9760
- 电子ISSN1469-8463
- 文件大小80.29KB
- 发表时间2009-10
- DOI10.1080/09669760903454264
- 页码237-246
[IEEE 12th IEEE International Symposium on Web Systems Evolution (WSE 2010) - Timisoara (2010.09.17-2010.09.18)] 2010 12th IEEE International Symposium on Web Systems Evolution (WSE) - 2010 12th IEEE International Symposium on Web Systems Evolution [Copyright notice]2010
[IEEE 12th IEEE International Symposium on Web Systems Evolution (WSE 2010) - Timisoara (2010.09.17-2010.09.18)] 2010 12th IEEE International Symposium on Web Systems Evolution (WSE) - [Covers]2010
[IEEE 12th IEEE International Symposium on Web Systems Evolution (WSE 2010) - Timisoara (2010.09.17-2010.09.18)] 2010 12th IEEE International Symposium on Web Systems Evolution (WSE) - WSE 2010 organization2010
[IEEE 12th IEEE International Symposium on Web Systems Evolution (WSE 2010) - Timisoara (2010.09.17-2010.09.18)] 2010 12th IEEE International Symposium on Web Systems Evolution (WSE) - Author index2010
[IEEE 12th IEEE International Symposium on Web Systems Evolution (WSE 2010) - Timisoara (2010.09.17-2010.09.18)] 2010 12th IEEE International Symposium on Web Systems Evolution (WSE) - WSE 2010 sponsors & supporters2010
[IEEE 12th IEEE International Symposium on Web Systems Evolution (WSE 2010) - Timisoara (2010.09.17-2010.09.18)] 2010 12th IEEE International Symposium on Web Systems Evolution (WSE) - Table of contents2010
[IEEE 2010 17th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA 2010) - Singapore, Singapore (2010.07.5-2010.07.9)] 2010 17th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits - Cover2010
[IEEE 12th IEEE International Symposium on Web Systems Evolution (WSE 2010) - Timisoara (2010.09.17-2010.09.18)] 2010 12th IEEE International Symposium on Web Systems Evolution (WSE) - Measuring web service interfacesSneed, Harry M · 2010
Bidirectional Diode-Triggered Silicon-Controlled Rectifiers for Low-Voltage ESD ProtectionLiu, Wen; Liou, Juin J.; Yeh, Han-Chih; Wang, Huei; Li, You; Yeo, Kiat Seng · IEEE Electron Device Letters · 2012
[IEEE 2010 17th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA 2010) - Singapore, Singapore (2010.07.5-2010.07.9)] 2010 17th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits - Evaluation of nanowire field-effect transistors for electrostatic discharge (ESD) applicationsLiu, Wen; Liou, Juin J.; You Li, ; Chung, J.; Jeong, Y. H. · 2010