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[IEEE 2010 15th IEEE European Test Symposium (ETS) - Praha, Czech Republic (2010.05.24-2010.05.28)] 2010 15th IEEE European Test Symposium - A diagnostic test generation system and a coverage metric

[IEEE 2010 15th IEEE European Test Symposium (ETS) - Praha, Czech Republic (2010.05.24-2010.05.28)] 2010 15th IEEE European Test Symposium - A diagnostic test generation system and a coverage metric

Zhang, Yu; Agrawal, Vishwani D.
  • 作者Zhang, Yu; Agrawal, Vishwani D.
  • 文件大小277.12KB
  • 发表时间2010
  • DOI10.1109/etsym.2010.5512739
  • 页码254-254
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