Postgraduate trainees' assessment of the educational value of ward rounds in obstetrics and gynaecology
- 期刊名称Journal of Obstetrics & Gynaecology
- 作者Qureshi, N. S.; Swamy, N. N.
- 卷第28卷
- 期第7期
- 印刷ISSN0144-3615
- 电子ISSN1364-6893
- 文件大小128.06KB
- 发表时间2008-01
- DOI10.1080/01443610802421858
- 页码671-675
[IEEE kshop on Junction Technology - Osaka, Japan (2005.06.7-2005.06.8)] Extended Abstracts of the Fifth International Workshop on Junction Technology - Which junction for advanced CMOS?-theory, benchmark and predictionsSkotnicki, T. · 2005
[IEEE kshop on Junction Technology - Osaka, Japan (2005.06.7-2005.06.8)] Extended Abstracts of the Fifth International Workshop on Junction Technology - Anomalous doping profile in heavily doped GeHosawa, K.; Matsumoto, K.; Shibahara, K. · 2005
[IEEE kshop on Junction Technology - Osaka, Japan (2005.06.7-2005.06.8)] Extended Abstracts of the Fifth International Workshop on Junction Technology - Benefits of heat-assist for laser annealingShibahara, K. · 2005
[IEEE kshop on Junction Technology - Osaka, Japan (2005.06.7-2005.06.8)] Extended Abstracts of the Fifth International Workshop on Junction Technology - Ultra low energy (ULE) implant dose and activation monitoringHillard, R.; Borland, J.; Benjamin, M. · 2005
[IEEE kshop on Junction Technology - Osaka, Japan (2005.06.7-2005.06.8)] Extended Abstracts of the Fifth International Workshop on Junction Technology - A new junction technology for low-resistance contacts and Schottky barrier MOSFETsGrupp, D.E.; Connelly, D.; Faulkner, C.; Clifton, P.A. · 2005
[IEEE kshop on Junction Technology - Osaka, Japan (2005.06.7-2005.06.8)] Extended Abstracts of the Fifth International Workshop on Junction Technology - Using boron cluster ion implantation to fabricate ultra-shallow junctionsJacobson, D. · 2005
[IEEE kshop on Junction Technology - Osaka, Japan (2005.06.7-2005.06.8)] Extended Abstracts of the Fifth International Workshop on Junction Technology - Properties of ion-implanted strained-Si/SiGe heterostructuresSugii, N.; Morioka, J.; Ishidoya, Y.; Koyama, K.; Inada, T. · 2005