![[IEEE 2014 9th IEEE International Conference on Nano/Micro Engineered and Molecular Systems (NEMS) - Waikiki Beach, HI, USA (2014.4.13-2014.4.16)] The 9th IEEE International Conference on Nano/Micro Engineered and Molecular Systems (NEMS) - The phenomenon of “sharp corner” of Electrolyte-Oxide-Semiconductor structure for copper ions detection]()
[IEEE 2014 9th IEEE International Conference on Nano/Micro Engineered and Molecular Systems (NEMS) - Waikiki Beach, HI, USA (2014.4.13-2014.4.16)] The 9th IEEE International Conference on Nano/Micro Engineered and Molecular Systems (NEMS) - The phenomenon of “sharp corner” of Electrolyte-Oxide-Semiconductor structure for copper ions detectionGao, J. G.; Wang, H.; Ma, P. C.; Wu, Wengang · 2014