![SPIE Proceedings [SPIE Photonics for Industrial Applications - Boston, MA (Monday 31 October 1994)] Machine Vision Applications, Architectures, and Systems Integration III - <title>Detection of secondary reflections using morphology</title>]()
SPIE Proceedings [SPIE Photonics for Industrial Applications - Boston, MA (Monday 31 October 1994)] Machine Vision Applications, Architectures, and Systems Integration III - <title>Detection of secondary reflections using morphology</title>Miller, John W. V.; Shabestari, Behrouz N.; Batchelor, Bruce G.; Solomon, Susan S.; Waltz, Frederick M. · 1994