Structural Defect Studies of Semiconductor Crystals with Laue Topography
- 期刊名称Solid State Phenomena
- 作者Gröschel, Alexander; Will, Johannes; Bergmann, Christoph; Grillenberger, Hannes; Eichler, Stefan; Scheffer Czygan, Max; Magerl, Andreas
- 电子ISSN1662-9779
- 文件大小5929.83KB
- 发表时间2011-8
- DOI10.4028/www.scientific.net/SSP.178-179.360
- 页码360-365
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Electromagnetic metamaterialsGrimberg, Raimond · Materials Science and Engineering: B · 2013
Editorial BoardMaterials Science and Engineering: B · 2013
Editorial BoardMaterials Science and Engineering: B · 2013
Editorial BoardMaterials Science and Engineering: B · 2013
Editorial BoardMaterials Science and Engineering: B · 2013
Inside front coverMaterials Science and Engineering: B · 2014
Editorial BoardMaterials Science and Engineering: B · 2013
author indexMaterials Science and Engineering: B · 2013