The Impact of Statistical Leakage Models on Design Yield Estimation
- 期刊名称VLSI Design
- 作者Kanj, Rouwaida; Joshi, Rajiv; Nassif, Sani
- 卷第2011卷
- 印刷ISSN1065-514X
- 电子ISSN1563-5171
- 文件大小2046.95KB
- 发表时间2011
- DOI10.1155/2011/471903
- 页码1-12
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